The product
Special features:
- Measuring range 450 to 1800 °C
- focusable interchangeable lenses for exact adjustment of the measuring distance
- broadband anti-reflective precision lenses
- short-wave and narrow-band spectral range
- particularly suitable for precise measurements on metals and on silicon wafers
- LED display can be read from a great distance
- test current output for the diagnostic function
- standard feature: analogue output and USB/RS 485 interface
| Version |
CellaWafer PA 38 AF 10 /D |
|---|---|
| Measuring range |
450 – 1800 °C |
| Focus distance |
0,3 m – ∞ |
| Shape of the measuring field |
round |
| Distance ratio |
40 : 1 |
| Objective |
PA 20.08 |
| Measuring principle |
one-colour |
| Sighting option |
Through-the-lens-sighting |
